Microstructural characterization of materials [2nd ed.]
By: Brandon, David.
Contributor(s): Kaplan, Wayne d.
Material type:
BookSeries: Quantitative software engineering series. Publisher: Chichester John Wiley & Sons 2008Edition: 2nd ed.Description: xiv, 536p.ISBN: 9780470027844.Subject(s): Materials -- MicroscopyDDC classification: 620.11299 | B734m2
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 620.11299 B734m2 cop.1 (Browse shelf) | Copy 1 | Checked out to YASHVARDHAN RATHORE (S20115400) | 06/05/2024 | A162886 | ||
Text Books
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PK Kelkar Library, IIT Kanpur | TEXT | 620.11299 B734m2 cop.2 (Browse shelf) | Copy 2 | Available | A165161 | |||
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Text Books
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PK Kelkar Library, IIT Kanpur | TEXT | 620.11299 B734m2 cop.3 (Browse shelf) | Copy 3 | Available | A165162 | |||
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Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 620.11299 B734m2 cop.4 (Browse shelf) | Copy 4 | Checked out to Yuvaraj Raghupathy (E0616400) | 13/07/2023 | A165163 |
Total holds: 0
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